XRD:X射线衍射仪
X射线衍射仪(X-Ray Diffractometer)是一种用于材料结构分析的重要科学仪器,常被简称为XRD,以便于书写和使用。该缩写形式广泛应用于材料科学、化学、物理及地质学等多个综合领域,是一个通用且未明确限定应用范围的常用术语。
X Ray Diffractometer具体释义
X Ray Diffractometer的英文发音
例句
- Polarization microscope, scan electronmicroscope and X ray diffractometer are applied separately to view and determine the fabric characteristics and orientated range of flat particles in samples.
- 本文中应用了偏光显微镜、扫描电子显微镜和X射线衍射仪(XRD)分别对试样的组构特征及扁平颗粒的定向排列特征作了观察和测定。
- In this paper, we apply X ray diffractometer method to determine the crystal space lattice constant of spectrum pure metallic copper Cu accurately.
- 用X射线衍射仪(XRD)法对光谱纯铜进行了点阵常数的精确测定,给出了测定值。
- METHODS : Study on the microstructure of Indigo Naturals with scanning electron microscope ( SEM ) and X ray diffractometer ( XRD ) were carried out.
- 方法:通过扫描电子显微镜(SEM)和X衍射(XRD)方法,对青黛的微观结构进行了研究。
- Phase identification and the quantity variation of carbides in the die steel are analyzed by the X ray diffractometer.
- X射线衍射仪(XRD)对碳化物相进行鉴定,分析了碳化物量随不同热处理的变化规律。
- Effect of AlN on properties of Sialon ceramics has been studied using x ray diffractometer and SEM method. The results show that AlN is effective for getting α Sialon.
- 采用X射线衍射及扫描电镜方法,从微观角度研究了氮化铝(AlN)对Sialon陶瓷性能的影响.结果表明:AlN对α-Sialon的生成有促进作用;
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