SAD:选区衍射
“选区衍射”(Selected Area Diffraction,常缩写为SAD)是电子显微学中的一种重要技术手段,主要用于对材料微观结构的晶体学分析。通过在透射电子显微镜中选择特定微小区域进行电子衍射,该技术能够有效获取材料的晶体结构、晶格参数及取向等信息。由于其名称较长,在学术写作和日常交流中普遍使用缩写SAD,既简洁又便于专业领域的快速沟通与应用。
Selected Area Diffraction具体释义
Selected Area Diffraction的英文发音
例句
- The microstructure of the film was characterized by X ray diffraction, transmission electron microscopy, and selected area diffraction.
- 电子显微探针分析仪用X射线衍射仪、射电镜及其选区衍射(SAD)来分析薄膜的微结构。
- By X ray and SEM, the change of powder microstructure was analyzed during ball milling. It has been verified that the mixture of amorphous phase, α Fe and Mo was obtained, combined with the analysis of selected area diffraction.
- 用X射线衍射及扫描电镜分析了球磨过程粉末微结构的变化,并结合选区电子衍射分析,证实球磨的最终产物为非晶、αFe和少量的Mo。
- The crystal structure and its lattice parameter of sapphire single crystal grown by EFG method was determined by selected area diffraction of transmission electron micrograph ( TEM ).
- 用透射电镜选区电子衍射(TEM)方法测试了导模法生长的白宝石单晶体的晶体结构和点阵常数。
- The selected area diffraction patterns from the phase show a fivefold symmetry of a qua-sierystalline structure.
- 这个相的选区电子衍射花样显示出准晶体结构的五次对称性。
- Calculated from diagram of Selected Area Diffraction(SAD) ( SAD ), the crystal structure of the mineral and the diffraction data are consistent with standard mineral native Fe - α and native Fe - γ from JCPDS.
- 选区电子衍射花样计算表明该矿物与和JCPDS中的标准矿物自然铁-α和自然铁-γ衍射数据一致。
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