HREM：高分辨率电子显微镜

高分辨率电子显微镜（High-Resolution Electron Microscopy，简称HREM）是电子显微技术中的重要分支，广泛应用于材料科学、纳米技术等学术研究领域。使用缩写HREM便于在论文和学术交流中快速书写与引用，有效提升了专业术语的表达效率。

High-resolution electron microscopy and selected-area electron diffraction confirmed the core of Ferumoxtran-10 is composed of crystalline magnetite.
高分辨电子显微镜和选区电子衍射证实Ferumoxtran-10的核是由晶体状的磁铁矿组成的。
In situ observation of electron-beam-irradiation induced crystallization in amorphous GaAs has been performed using high-resolution electron microscopy.
利用高分辨电子显微镜对电子束辐照诱发非晶GaAs晶化过程现象进行了原位观察。
Preferred orientation of graphite basic plane was observed by high-resolution electron microscopy. Shallow ion implantation and stress are responsible for this orientation.
用高分辨电子显微镜看到了石墨平面的垂直择优取向，离子的浅注入和应力是这种优先取向的主要机理。
High-resolution electron microscopy ( HREM ) is used to record the changes in the crystals. The lattice image, which acts as a specimen grating, is superposed onto a standard grating to produce moire fringes.
用晶体材料作试件，利用高空间分辨电子显微技术（HREM）记录晶格的变化，把它作为试件光栅，与一标准参考栅叠合形成云纹条纹。
High-resolution electron microscopy studies of the ordering structure of high purity steel bearing copper
含铜高纯钢中有序结构的高分辨电子显微分析

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