SEMS:扫描电子显微镜
扫描电子显微镜,其英文全称为Scanning Electron Microscope,常被缩写为SEM。在书写和日常使用时,为了方便快捷,有时也出现复数形式SEM的简写SEMS。这种设备广泛应用于多个综合性领域,属于未严格分类的常用科学仪器之一。
scanning electron microscope SEM具体释义
scanning electron microscope SEM的英文发音
例句
- This paper introduces the new development of the detector used in scanning electron microscope ( SEM ).
- 介绍了扫描电子显微镜(SEMS)(SEM)信号探头研究的最新成果。
- These adsorbents were characterized by N2 adsorption-desorption, scanning electron microscope ( SEM ) and X-ray fluorescence spectrum techniques.
- 通过N2吸附脱附试验、扫描电子显微镜(SEMS)(SEM)、X射线荧光光谱仪对脱硫吸附剂的性能进行了表征。
- A special machine with scanning electron microscope ( SEM ) used was designed for three point bending test.
- 设计了一种可用扫描电镜(SEM)动态观察、专门用于三点弯曲试验的特殊装置。
- From scanning electron microscope ( SEM ) and ( AFM ) atomic force microscope images, it is observed that both grain size and surface roughness are aggrandized greatly after annealing.
- 从扫描电子显微镜(SEMS)(SEM)和原子力显微镜(AFM)图像可以观察到,薄膜在退火后其晶粒尺寸和粗糙度都大大增加。
- This paper analysed the pattern and composition of residual metal in diamond fracture surface by ways of Scanning Electron Microscope ( SEM ) and Energy Dispersion Spectrum ( EDS ).
- 采用扫描电镜(SEM)和能谱(EDS)分析方法,分析了国内六种代表性的金刚石断面上残留触媒的形态及成分。
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