ICMS:集成电路测量系统
集成电路测量系统(Integrated Circuit Measurement System,常缩写为ICMS)是一种广泛用于电子工程和学术研究领域的专业设备。该系统主要用于对集成电路的各项性能和参数进行精确测量与分析,有助于提升芯片设计的准确性和可靠性。在科研和工业实践中,ICMS的缩写形式因其书写简便、表达高效而被频繁使用。
Integrated Circuit Measurement System具体释义
Integrated Circuit Measurement System的英文发音
例句
- The instrument is integrated with a multi-channel high precision open circuit potential measurement system for the ion selective electrode and a potentiostat used in voltammetry, an analog lock-in amplifier is also presented to measure the response of light addressable potential sensor.
- 对于不同的测量技术,仪器中集成了用于测量电极的多通道高精度开路电压测量系统和用于溶出伏安法测量的多路电化学测量系统,以及用于测量光寻址电位传感器的锁相放大器。
- With the development of technology of the computer and large scale integrated circuit technology, in modern nuclear electronics measurement, use the system of very large scale integration circuit and high-speed real-time processing software to replace the traditional analog measuring system.
- 随着计算机技术与大规模集成电路技术的发展,在现代核电子学测量中,正在大量使用超大规模集成电路与高速实时处理软件组成的系统取代传统的模拟测量系统。
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