ISD:界面状态密度
在电子学与半导体物理学等学术科技领域,为了便于快速书写与交流,人们常将“Interface State Density”(界面状态密度)缩写为“ISD”。这一术语主要用于描述半导体器件界面处的电子态分布特性,对器件性能分析具有重要意义。
Interface State Density具体释义
Interface State Density的英文发音
例句
- An effective way of decreasing bulk electron trap density and interface state density is put forward.
- 提出降低体电子陷阱密度和界面态密度的有效途径。
- The effect of interface state charges on the threshold voltage, drain current, transconductance and field-effect mobility of n-channel SiC MOSFET is analyzed with numerical method by establishing the model of the interface state density exponential distribution.
- 建立界面态密度的指数分布模型,用数值方法较为详细的分析了界面态电荷对n沟MOSFET器件阈值,漏电流,跨导和场效应迁移率的影响。
- The effect of interface state charges on the field effect mobility of n channel 6H SiC MOSFET is analyzed based on the nonuniform distribution of interface state density in the energy gap.
- 针对界面态密度在禁带中的不均匀分布,分析了界面态电荷对n沟6H碳化硅MOSFET场效应迁移率的影响。
- A Direct Display Method for Measuring MOS Interface State Density(ISD) Distribution
- MOS系统界面态密度分布的一种直接显示法
- In this paper the series resistance for silicon MIS / IL solar cells related with the thickness of evaporated SiO coating, the fixed positive charge density in the coating and the interface state density has been indicated.
- 本文讨论了MIS/IL太阳电池的串联电阻与蒸发SiO膜厚度、膜中的固定正电荷密度、界面态密度之间的关系。
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