SEM:扫描电子显微镜
扫描电子显微镜(Scanning Electron Microscopy),通常缩写为SEM,是一种广泛应用于材料科学、生物学、医学等综合领域的高精度观测技术。该缩写形式便于书面和口头交流,能够有效提升专业术语的使用效率,并避免冗长的全称表述。
Scanning Electron Microscopy具体释义
Scanning Electron Microscopy的英文发音
例句
- The synthesized zeolites were characterized by X-ray diffraction ( XRD ) and scanning electron microscopy ( SEM ).
- 分别采用X射线衍射(XRD)和扫描电子显微镜(SEM)(SEM)对样品进行了表征。
- The braze and interfacial microstructures were characterized by optical microscopy, scanning electron microscopy, and energy dispersive spectroscopy.
- 在钎焊和界面微观结构的特点是光学显微镜,扫描电子显微镜(SEM)和能谱。
- These features are examined by optical microscopy, scanning electron microscopy, and transmission electron microscopy.
- 这些图形可以用光学显微镜,扫描电子显微镜(SEM)和透射电子显微镜来观察。
- Scanning electron microscopy ( SEM ) was employed to determine the morphology of the substrate and surface energy was calculated.
- 利用扫描电镜(SEM)分析不同基底的表面形貌和计算了相应的表面能。
- Transmission and scanning electron microscopy examinations showed that these polymers adhered well to CNT at the nanometer scale.
- 透射电镜和扫描电子显微镜(SEM)考试结果显示,这些聚合物坚持以碳纳米管在纳米尺度。
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