SAED:选区电子衍射
在电子显微镜相关的学术研究领域,为了书写与交流的便捷,“Selected Area Electron Diffraction”通常被缩写为SAED。这一技术的中文名称为“选区电子衍射”,主要用于对材料的微区结构进行分析,是材料科学与纳米科技中一种重要的表征手段。
Selected Area Electron Diffraction具体释义
Selected Area Electron Diffraction的英文发音
例句
- High resolution transmission electron microscopy and selected area electron diffraction were used to characterize the products.
- 利用高分辨透射电镜和电子衍射仪器对合成的纳米颗粒的结构进行了表征。
- The particles were observed by TEM and the selected area electron diffraction patterns of nickel powders were shown;
- 运用TEM技术观察了两种粉体的形貌,并给出了选区电子衍射(SAED)图;
- The selected area electron diffraction and EDX analyze is confirm that the products are one-dimensional Cu-Zn-Al alloy nano-structures.
- 根据EDX以及选区衍射确定了产物为一维Cu-Zn-Al合金纳米结构。
- A silver thin film has been producted by sputtering process and the electron micrograph and the selected area electron diffraction pattern of the silver thin film have been observed by TEM.
- 作者用溅射法制作了银薄膜,并通过透射电子显微镜观察了银薄膜的电子显微像和选区电子衍射(SAED)环。
- Components and structures of the final products were characterized with X ray diffraction ( XRD ), high resolution transmission electron microscopy ( HRTEM ), X ray energy dispersive spectra and selected area electron diffraction ( SAED ).
- 通过X射线衍射(XRD),高分辨率透射电镜(HRTEM),X射线能散射谱(EDX)及选区电子衍射(SAED)(SAED)等手段对产物进行了组成和结构表征。
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