AFM:原子力显微镜
原子力显微镜(Atomic Force Microscope,常简写为AFM)是一种在医学和生物研究领域被广泛使用的精密检测仪器。该缩写形式便于书写与口头交流,尤其在医院、实验室等专业场景中频繁出现,有助于提升工作效率和信息传递的准确性。
Atomic Force Microscope具体释义
Atomic Force Microscope的英文发音
例句
- Atomic force microscope ( AFM ) was used to characterize the cellulose nanocrystal.
- 利用原子力显微镜(AFM)(AFM)探测了纳米纤维素的形貌特征;
- A novel large-stage atomic force microscope ( AFM ) for nondestructive characterization of optical thin films is built.
- 研制了一种用于大面积光学薄膜表面无损表征的新型原子力显微镜(AFM)(AFM)。
- The principle of the friction force microscope ( FFM ) based on the atomic force microscope is presented.
- 介绍了在原子力显微镜(AFM)基础上发展起来的摩擦力显微镜的原理。
- Bending deformation of microscale cantilever has been investigated using an atomic force microscope ( AFM ).
- 采用原子力显微镜(AFM)测试了微悬臂梁构件的弯曲变形规律。
- From scanning electron microscope ( SEM ) and ( AFM ) atomic force microscope images, it is observed that both grain size and surface roughness are aggrandized greatly after annealing.
- 从扫描电子显微镜(SEM)和原子力显微镜(AFM)(AFM)图像可以观察到,薄膜在退火后其晶粒尺寸和粗糙度都大大增加。
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